EIS Study - 254


Study Details

Parameter Value
ID 254
ACRONYM cme_slot_red_lkh
TITLE filament study: slot raster for context image
TARGET Quiet Sun
NO. OF RASTERS 1

Raster #1

Parameter Value
RASTER ID 242
ACRONYM cme_slot_red
LL_ID 118
RASTER TYPE SCANNING
NO. OF POINTING POSITIONS 3
SCAN STEP SIZE (arcsec) 40
NO. OF WINDOWS 9
WINDOW WIDTHS (pixels) 56,8,56,56,56,56,56,56,56
WINDOW HEIGHT (pixels) 512
SLIT/SLOT 3
EXPOSURE TIMES (ms) 30000
EXPOSURE DELAY (ms) 0

Line List #1

Line Wavelength (Angstroms)
FeX 184.54
FeXXIV 192.04
CaXVII 192.82
FeXII 195.12
FeXIII 202.04
HeII 256.32
SiX 258.37
SiX 261.04
SiVII 275.35



Last Revised: Monday, 29-Jun-2007

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