EIS Study - 255


Study Details

Parameter Value
ID 255
ACRONYM cme_slit_red_lkh
TITLE filament study: slit raster
TARGET Quiet Sun
NO. OF RASTERS 1

Raster #1

Parameter Value
RASTER ID 243
ACRONYM CME_slit_red
LL_ID 118
RASTER TYPE SCANNING
NO. OF POINTING POSITIONS 61
SCAN STEP SIZE (arcsec) 4
NO. OF WINDOWS 9
WINDOW WIDTHS (pixels) 24,32,32,24,24,32,32,32,32
WINDOW HEIGHT (pixels) 504
SLIT/SLOT 2
EXPOSURE TIMES (ms) 30000
EXPOSURE DELAY (ms) 0

Line List #1

Line Wavelength (Angstroms)
FeX 184.54
FeXXIV 192.04
CaXVII 192.82
FeXII 195.12
FeXIII 202.04
HeII 256.32
SiX 258.37
SiX 261.04
SiVII 275.35



Last Revised: Monday, 29-Jun-2007

Feedback and comments: webmaster

Email
 
Print
    
EIS partner logo