EIS Study - 280


Study Details

Parameter Value
ID 280
ACRONYM cmeo_slot_lo
TITLE CME Onset - slot study - lo telemetry rate
TARGET Active Region
NO. OF RASTERS 1

Raster #1

Parameter Value
RASTER ID 265
ACRONYM cmeo_slot_lo
LL_ID 128
RASTER TYPE SCANNING
NO. OF POINTING POSITIONS 6
SCAN STEP SIZE (arcsec) 40
NO. OF WINDOWS 5
WINDOW WIDTHS (pixels) 40,40,40,40,40
WINDOW HEIGHT (pixels) 320
SLIT/SLOT 3
EXPOSURE TIMES (ms) 30000
EXPOSURE DELAY (ms) 0

Line List #1

Line Wavelength (Angstroms)
FeXII 186.75
OV 192.90
FeXII 195.12
HeII 256.32
FeXVI 262.98



Last Revised: Monday, 29-Jun-2007

Feedback and comments: webmaster

Email
 
Print
    
EIS partner logo