EIS Study - 375


Study Details

Parameter Value
ID 375
ACRONYM SK_DEEP_5x512_SLIT1
TITLE Deep exposures with 1 arcsec slit for measuring precise velocity
TARGET Quiet Sun
NO. OF RASTERS 1

Raster #1

Parameter Value
RASTER ID 359
ACRONYM SK_DEEP_5x512_SLIT1
LL_ID 193
RASTER TYPE SCANNING
NO. OF POINTING POSITIONS 5
SCAN STEP SIZE (arcsec) 1
NO. OF WINDOWS 16
WINDOW WIDTHS (pixels) 24,24,24,32,48,24,24,24,24,24,24,24,24,24,24,24
WINDOW HEIGHT (pixels) 512
SLIT/SLOT 0
EXPOSURE TIMES (ms) 120000
EXPOSURE DELAY (ms) 0

Line List #1

Line Wavelength (Angstroms)
FeXI 180.40
FeX 184.54
FeVIII 186.60
FeXI 188.23
CaXVII 192.63
FeXII 195.12
FeXIII 202.04
OV 248.46
HeII 256.32
FeX 257.26
SiX 261.04
FeXIV 264.78
MgVI 269.00
SiVII 275.35
OIV 279.93
FeXV 284.16



Last Revised: Monday, 29-Jun-2007

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