EIS Study - 376


Study Details

Parameter Value
ID 376
ACRONYM SK_DEEP_10x512_SLIT2
TITLE Deep exposure with 2 arcsec slit for measuring precise velocity
TARGET Quiet Sun
NO. OF RASTERS 1

Raster #1

Parameter Value
RASTER ID 360
ACRONYM SK_DEEP_10x512_SLIT2
LL_ID 193
RASTER TYPE SCANNING
NO. OF POINTING POSITIONS 5
SCAN STEP SIZE (arcsec) 2
NO. OF WINDOWS 16
WINDOW WIDTHS (pixels) 24,24,24,32,48,24,24,24,24,24,24,24,24,24,24,24
WINDOW HEIGHT (pixels) 512
SLIT/SLOT 2
EXPOSURE TIMES (ms) 60000
EXPOSURE DELAY (ms) 0

Line List #1

Line Wavelength (Angstroms)
FeXI 180.40
FeX 184.54
FeVIII 186.60
FeXI 188.23
CaXVII 192.63
FeXII 195.12
FeXIII 202.04
OV 248.46
HeII 256.32
FeX 257.26
SiX 261.04
FeXIV 264.78
MgVI 269.00
SiVII 275.35
OIV 279.93
FeXV 284.16



Last Revised: Monday, 29-Jun-2007

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