EIS Study - 389


Study Details

Parameter Value
ID 389
ACRONYM calib_slit_slot_v2
TITLE Calibration study for measuring slit tilts and widths
TARGET Quiet Sun
NO. OF RASTERS 3

Raster #1

Parameter Value
RASTER ID 335
ACRONYM Slit_Slot_40_v1
LL_ID 177
RASTER TYPE SCANNING
NO. OF POINTING POSITIONS 3
SCAN STEP SIZE (arcsec) 32
NO. OF WINDOWS 7
WINDOW WIDTHS (pixels) 40,40,40,40,40,40,40
WINDOW HEIGHT (pixels) 512
SLIT/SLOT 3
EXPOSURE TIMES (ms) 20000
EXPOSURE DELAY (ms) 0

Line List #1

Line Wavelength (Angstroms)
FeVIII 185.21
FeXII 195.12
FeXIII 202.04
FeXIII 203.83
HeII 256.32
SiVII 275.37
FeXV 284.16

Raster #2

Parameter Value
RASTER ID 373
ACRONYM Slit_Slot_1_v2
LL_ID 202
RASTER TYPE SCANNING
NO. OF POINTING POSITIONS 15
SCAN STEP SIZE (arcsec) 1
NO. OF WINDOWS 10
WINDOW WIDTHS (pixels) 24,24,32,32,24,24,32,88,24,24
WINDOW HEIGHT (pixels) 512
SLIT/SLOT 0
EXPOSURE TIMES (ms) 120000
EXPOSURE DELAY (ms) 0

Line List #2

Line Wavelength (Angstroms)
FeXI 180.40
FeVIII 185.21
FeXII 193.54
FeXII 195.12
FeIX 197.86
FeXIII 202.04
FeXIII 203.83
FeX 257.68
SX 264.23
SiVII 275.35

Raster #3

Parameter Value
RASTER ID 374
ACRONYM Slit_Slot_2_v2
LL_ID 202
RASTER TYPE SCANNING
NO. OF POINTING POSITIONS 15
SCAN STEP SIZE (arcsec) 2
NO. OF WINDOWS 10
WINDOW WIDTHS (pixels) 24,24,32,32,24,24,32,88,24,24
WINDOW HEIGHT (pixels) 512
SLIT/SLOT 2
EXPOSURE TIMES (ms) 80000
EXPOSURE DELAY (ms) 0

Line List #3

Line Wavelength (Angstroms)
FeXI 180.40
FeVIII 185.21
FeXII 193.54
FeXII 195.12
FeIX 197.86
FeXIII 202.04
FeXIII 203.83
FeX 257.68
SX 264.23
SiVII 275.35



Last Revised: Monday, 29-Jun-2007

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