EIS Study - 429


Study Details

Parameter Value
ID 429
ACRONYM js2_decon_slot_sc_LT
TITLE js2_decon_slot_scan_LT
TARGET Active Region
NO. OF RASTERS 1

Raster #1

Parameter Value
RASTER ID 407
ACRONYM js2_40slot_scan_v3
LL_ID 221
RASTER TYPE SCANNING
NO. OF POINTING POSITIONS 5
SCAN STEP SIZE (arcsec) 30
NO. OF WINDOWS 4
WINDOW WIDTHS (pixels) 48,56,56,48
WINDOW HEIGHT (pixels) 512
SLIT/SLOT 3
EXPOSURE TIMES (ms) 15000
EXPOSURE DELAY (ms) 0

Line List #1

Line Wavelength (Angstroms)
FeXXIV 192.04
FeXII 193.52
FeXII 195.12
FeXIV 211.34



Last Revised: Monday, 29-Jun-2007

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